General Description

The ROTA-SONDE DC 2000 is a scanning detector, sensitive to the infrared radiation emitted by a hot product. It is a self-contained detector consisting of: a case for the opto-electronics, air-purging system and electrical connection a cooling jacket with adjustable mounting stand Its design and particularly its cast aluminium case make it a detector specially adapted to the harsh environment of the steel industry.Application Up Sensitive to infrared radiation, the ROTA-SONDE DC 2000 is a Hot Metal Detector for the detection of material at temperatures over 400 °C / 750 °F. The DC2000 is can be used for the detection of hot metal in most of the application encountered in rolling mills and continuous casters.

Features

• Range of material temperature: 400 °C / 750 °F
• Scanning angle: 10°, 30°, 50°
• Relay and static output
• Response time : static output 1 ms for DC2010, 2 ms for DC2030, 4 ms for DC2050
• Ambient temperature : - 20 °C / 0 °F to 60 °C / 140 °F - Up to 120 °C / 250 °F with water cooling.
• Cast aluminium housing IP66

Optimum distance between sensor and the product to detect:

Working Principle

Scanning system:
The detection field is scanned by a rotating polygonal mirror. When the analytical beam of the sensor detects infrared radiation from a hot product within the scanned field, the reflection of that radiation by the mirror onto the measuring cell provides a signal which is processed and a logic state is output as long as the product is within the field scanned by the detector.

Because of exclusive optical scanning principle, the ROTA-SONDE DC 2000 offers the following advantages :

• Easy alignment and reliable detection, regardless of the transverse position of the product, thanks to the large vertical field angle.
• Accurate detection because of the narrow lateral field - Reliable detection due to the small analysing beam

All these features give accurate and reliable detection, whatever the dimensions and the temperature of the product, or its distance and its position in the scanned field.